ENGINEERING METROLOGY AND INSTRUMENTATION 1) THE PLACE OF MEASUREMENT INSTRUMENTATION, AND LABORATORY 1.1 Introduction 1.2. Significance of Measurement and Instrumentation 1.3. Measuring System A. The Transducer and Its Environmental An Overview B. The Nature of Measurement A Design Problem C. Functional Stages of Measurement System D. The Sensing Process E. Examples of Typical Sensors 1.4. The Measurement Problem A. Valid Measurements B. Measuring System 1.5. The Instrumentation Problem 1.6. The Laboratory Problem A. Experimentation B. Goals and Implementation C. Laboratory Experience 1.7. Reports 1.8. Nomenclature 1.9. Units and Standard 2) TRANSDUCERS 2.1. Physical Laws A. First order Effects: Signal/Noise Ratio B. Second-Order and Irreversible Effects 2.2. Static Characteristics A. Obtaining a Static Characteristic Curve B. Linear Characteristics C. Common Nonlinearities D. Effects of Nonlinearities E. Linearization 2.3. Transducer Types and Modeling A. Information Models B. Energy Models C. Incremental Models 2.4. Calibration 2.5. Errors in Measurement A. Accuracy, Precision, Uncertainty, Mistakes B. Systematic and Random Errors C. Engineering Data 2.6. Uncertainty Analysis A. Overall Uncertainty B. Estimation for Design C. Selection of Alternative Test Methods 3) STRUCTURE OF MEASURING SYSTEM 3.1. Methods of Measurement A. Null-Balanced Method B. Unbalanced Method C. Differential Method D. Inferential Between Components 3.2. Comparison of Methods of Measurement 3.3. Interaction between Components A. Concept of Impedance B. One-Port Devices C. Two-port Devices D. Three-Port Devices: Amplifiers 3.4. Bridge Circuits A. Null-Balanced System B. Unbalance and Differential System 3.5. Basic Transducer Circuit A. Ideal Power Sources B. Non ideal Power Sources 3.6. System with Feedback A. System Description B. Effects on Characteristics of Components C. Effects on System Performance 3.7. Methods of Noise Reduction A. Noise Reduction at the Interface B. Noise Reduction by Insensitivity 3.8. Noise Documentation 4) DYNAMIC CHARACTERISTICS OF INSTRUMENTATION 4.1. Introduction 4.2. Modeling 4.3. Time Response of Instruments A. Test Signals B. Zero-Order Instruments C. First-Order Instruments D. Second-Order Instruments 4.4. Analog Data: Errors and Correction A. Requirements for Adequate Response B. Dynamic Errors C. Corrections for Analog Data 4.5. Limitations of Time-Domain Analysis 4.6. Frequency Response of Instruments A. Elementary Transfer Functions B. Bode Plots of General Transfer Functions C. Dynamic Compensation 4.7. Response to Periodic Signals A. Fourier Spectrum B. Response to Periodic Signals 4.8. Response to Transient Signals A. Frequency Contents of Transients B. Response to Transient Signals C. Transient Test Signals 5) NONSELF-GENERATING TRANSDUCER AND APPLICATION 5.1. Introduction 5.2. Differential Transformers 5.3. Differential Transformers: Applications 5.4. Carrier System A. Amplitude Modulation: Sine-Wave Carrier B. Types of Carriers 5.5. Inductive Transducer 5.6. Inductive Transducers: Application 5.7. Strain Gases A. Biaxial Stresses B. Gases Selection C. Strain Gage Circuits 5.8. Strain Gages: Application 5.9. Capacitive Transducers 5.10. Capacitive Transducers: Application 6) SIGNAL CONDITIONING AND OUTPUT DEVICES 6.1. Introduction 6.2. Operational Amplifiers: Characteristics 6.3. Operational Amplifiers: Basic Circuit 6.4. Op-Amp Amplifiers and Applications A. Amplifiers B. Applications 6.5. Binary Numbering System 6.6. Digital Techniques A. Logic Gates B. Boolean Algebra C. Flip-Flops 6.7. Functional Logic Circuits A. Encoders- Decoders B. Multiplexers- De multiplexers C. Sample-and-Hold D. Counters E. Analog/ Digital Converters 6.8. Output Devices A. Cathode- Ray Oscilloscopes B. Digital Electronic Counters C. Magnetic Tape and Disk Recorders D. Strips-Chart Recorders and X-Y Plotters’ E. Stroboscopes 6.9. Output/Storage Devices A. Digital Storage Oscilloscopes B. Digital Signal Analyzers C. Fast Fourier Transform D. Sampling E. Data Acquisition Systems 7) DISPLACEMENT, MOTION, FORCE, TORQUE, AND PRESSURE MEASUREMENT 7.1. Introduction 7.2. Dimension and Displacement Measurements A. Gage Blocks: The Working Standards B. Examples: Mechanical Methods C. Examples: Others Methods 7.3. Motion Measurements 7.4. Velocity Measurements 7.5. Acceleration Measurements A. Seismic Instruments B. Accelerometers C. Equivalent Circuits D. Environmental Effects E. Calibration 7.6. Force Measurements A. Dynamic Force Measurements B. Transient Calibration of Force Transducers and Accelerometers 7.6. Force Measurements A. Dynamic Force Measurement B. Transient Calibration of Force Transducers and Acceleration 7.7. Torque Measurements 7.8. Pressure Measurements A. Sensing Elements B. Applications C. Installations D. Calibrations 8) FLUID-FLOW MEASUREMENTS 8.1. Introduction 8.2. Laminar and Turbulent Flow 8.3. “Direct” Flow Measurement A. Weighing and Volumetric Methods B. Positive-Displacement Meters C. Flow Visualization D. “Carrier” System 8.4. “Indirect” Flow Measurement 8.5. Square-Roots-Law Flow meters A. Orifice and Ventura Flow meters B. Characteristics of Square-Root-Law Flow meters C. Pilot-Static Tubes D. Variable-Area Flow Meters E. Drag-Force Flow meter 8.6. Turbine Flow meters 8.7. Vortex-Shedding Flow meters 8.8. Hot-Wire and Hot- Film Anemometer A. Constant-Temperature Anemometer B. Constant-Current Anemometer 8.9. Mass Flow meters A. Density Measurement B. Direct Mass Flow meters 9) TEMPERATURE MEASUREMENT 9.1. Introduction 9.2. International Practical Temperature Scale 9.3. Expansion and Filled Thermometers 9.4. Thermocouples A. Thermoelectric Effects B. Thermoelectric Laws C. Gradient Approach to Thermocouple Circuitry D. Reference Junctions E. Thermocouple Probes F. Practical Thermocouple Measurement 9.5. Resistance Temperature Detectors A. Material and Constructors B. Characteristics and Standards C. Circuits D. Sources of Errors 9.6. Thermostats 9.7. Pyrometers: Principles A. Physical Laws B. Remittance C. Measurement Uncertainty 9.8. Promoters A. Brightness Pyrometers B. Wideband and Selected-Band Pyrometer C. Components 9.9. Miscellaneous Temperature Sensors 10) LABORATORY EXPERIMENT 10.1. Introduction 10.2. Experiment 1. Voltage Measurements: Oscilloscopes, Millimeters, and Digital Millimeters E1.1. Objectives E1.2. Introduction E1.3. Description of Equipments E1.4. Voltage Measurements: Experiment1-1 E1.5. Input/output Imepedances: Experiment1-2 E1.6. Loading in Measurements: Experiment1-3 E1.7. AC/DC Input Coupling: Experiment1-4 E1.8. Measurement of C in the AC Couple: Experiment1-5 E1.9.Trigger System of Oscilloscopes: Experiment1-6 E1.10. Probe Compensation: Experiment1-7 E1.11. Miscellaneous Controls: Experiment1-8 10.3. Experiment 2.Transducer and Physical Laws E2.1. Introduction E2.2. Equipment E2.3. Resistive Transducer E2.4. Capacitive Transducer E2.5. Inductive Transducer E2.6. Other Common Transducer 10.4. Experiment 3. Measuring Systems E3.1. Introduction E3.2. Acoustic Pressure Detection E3.3. Vibration of a Simple Beam 10.5. Experiment 4. Strain Gage Application E4.1. Objective E4.2. Introduction E4.3. Stress-Strain Relations: A Review E4.4. Strain Gages and Gage Circuit E4.5. Flexures and Cross-Sensitivity E4.6. Equipments E4.7. Laboratory Experience E4.8. Pressure Transducer Calibration: Experiment4-1 E4.9. Direct and Indirect Calibrations: Experiment4-2 E4.10. Simply Supported Beam: Experiment4-3 E4.11. Tensile Test: Experiment4-4 E4.12. Compression Test: Experiment4-5 E4.13. Cross-Sensitivity: Experiment4-6 E4.14. Torsion and Bending: Experiment4-7 E4.15. Long Thin-Walled Cylindrical: Experiment4-8 E4.16. Biaxial Strain Measurements: Experiment4-9 10.6. Experiment 5. Time Response of Instruments E5.1. Introduction E5.2.The Models E5.3. Demonstration of Zero-Order Instrumentation E5.4. Demonstration of First-Order Instrumentation E5.5. First-Order Instrumentation E5.6. Demonstration of Second-Order Instrumentation E5.7. Second-Order System: Experiment 5-3 10.7. Experiment 6. Frequency Response of Instrumentation E6.1. Frequency Response Method E6.2. Demonstration of Zero-Order Instrumentation E6.3. First-Order Instruments E6.4. Second-Order Instruments 10.8. Experiments 7.Signal Conditioning E7.1. Introduction E7.2.Demonstration of Thermocouple Compensation E7.3. Demonstration of Carrier Systems E7.4. Demonstration of Amplitude Modulation and Demolition E7.5. Characteristics of Filters E7.6. Operational Amplifiers
1) THE PLACE OF MEASUREMENT INSTRUMENTATION, AND LABORATORY
1.1 Introduction
1.2. Significance of Measurement and Instrumentation
1.3. Measuring System
A. The Transducer and Its Environmental
An Overview
B. The Nature of Measurement
A Design Problem
C. Functional Stages of Measurement System
D. The Sensing Process
E. Examples of Typical Sensors
1.4. The Measurement Problem
A. Valid Measurements
B. Measuring System
1.5. The Instrumentation Problem
1.6. The Laboratory Problem
A. Experimentation
B. Goals and Implementation
C. Laboratory Experience
1.7. Reports
1.8. Nomenclature
1.9. Units and Standard
2) TRANSDUCERS
2.1. Physical Laws
A. First order Effects: Signal/Noise Ratio
B. Second-Order and Irreversible Effects
2.2. Static Characteristics
A. Obtaining a Static Characteristic Curve
B. Linear Characteristics
C. Common Nonlinearities
D. Effects of Nonlinearities
E. Linearization
2.3. Transducer Types and Modeling
A. Information Models
B. Energy Models
C. Incremental Models
2.4. Calibration
2.5. Errors in Measurement
A. Accuracy, Precision, Uncertainty, Mistakes
B. Systematic and Random Errors
C. Engineering Data
2.6. Uncertainty Analysis
A. Overall Uncertainty
B. Estimation for Design
C. Selection of Alternative Test Methods
3) STRUCTURE OF MEASURING SYSTEM
3.1. Methods of Measurement
A. Null-Balanced Method
B. Unbalanced Method
C. Differential Method
D. Inferential Between Components
3.2. Comparison of Methods of Measurement
3.3. Interaction between Components
A. Concept of Impedance
B. One-Port Devices
C. Two-port Devices
D. Three-Port Devices: Amplifiers
3.4. Bridge Circuits
A. Null-Balanced System
B. Unbalance and Differential System
3.5. Basic Transducer Circuit
A. Ideal Power Sources
B. Non ideal Power Sources
3.6. System with Feedback
A. System Description
B. Effects on Characteristics of Components
C. Effects on System Performance
3.7. Methods of Noise Reduction
A. Noise Reduction at the Interface
B. Noise Reduction by Insensitivity
3.8. Noise Documentation
4) DYNAMIC CHARACTERISTICS OF INSTRUMENTATION
4.1. Introduction
4.2. Modeling
4.3. Time Response of Instruments
A. Test Signals
B. Zero-Order Instruments
C. First-Order Instruments
D. Second-Order Instruments
4.4. Analog Data: Errors and Correction
A. Requirements for Adequate Response
B. Dynamic Errors
C. Corrections for Analog Data
4.5. Limitations of Time-Domain Analysis
4.6. Frequency Response of Instruments
A. Elementary Transfer Functions
B. Bode Plots of General Transfer Functions
C. Dynamic Compensation
4.7. Response to Periodic Signals
A. Fourier Spectrum
B. Response to Periodic Signals
4.8. Response to Transient Signals
A. Frequency Contents of Transients
B. Response to Transient Signals
C. Transient Test Signals
5) NONSELF-GENERATING TRANSDUCER AND APPLICATION
5.1. Introduction
5.2. Differential Transformers
5.3. Differential Transformers: Applications
5.4. Carrier System
A. Amplitude Modulation: Sine-Wave Carrier
B. Types of Carriers
5.5. Inductive Transducer
5.6. Inductive Transducers: Application
5.7. Strain Gases
A. Biaxial Stresses
B. Gases Selection
C. Strain Gage Circuits
5.8. Strain Gages: Application
5.9. Capacitive Transducers
5.10. Capacitive Transducers: Application
6) SIGNAL CONDITIONING AND OUTPUT DEVICES
6.1. Introduction
6.2. Operational Amplifiers: Characteristics
6.3. Operational Amplifiers: Basic Circuit
6.4. Op-Amp Amplifiers and Applications
A. Amplifiers
B. Applications
6.5. Binary Numbering System
6.6. Digital Techniques
A. Logic Gates
B. Boolean Algebra
C. Flip-Flops
6.7. Functional Logic Circuits
A. Encoders- Decoders
B. Multiplexers- De multiplexers
C. Sample-and-Hold
D. Counters
E. Analog/ Digital Converters
6.8. Output Devices
A. Cathode- Ray Oscilloscopes
B. Digital Electronic Counters
C. Magnetic Tape and Disk Recorders
D. Strips-Chart Recorders and X-Y Plotters’
E. Stroboscopes
6.9. Output/Storage Devices
A. Digital Storage Oscilloscopes
B. Digital Signal Analyzers
C. Fast Fourier Transform
D. Sampling
E. Data Acquisition Systems
7) DISPLACEMENT, MOTION, FORCE, TORQUE, AND PRESSURE MEASUREMENT
7.1. Introduction
7.2. Dimension and Displacement Measurements
A. Gage Blocks: The Working Standards
B. Examples: Mechanical Methods
C. Examples: Others Methods
7.3. Motion Measurements
7.4. Velocity Measurements
7.5. Acceleration Measurements
A. Seismic Instruments
B. Accelerometers
C. Equivalent Circuits
D. Environmental Effects
E. Calibration
7.6. Force Measurements
A. Dynamic Force Measurements
B. Transient Calibration of Force Transducers and Accelerometers
A. Dynamic Force Measurement
B. Transient Calibration of Force Transducers and Acceleration
7.7. Torque Measurements
7.8. Pressure Measurements
A. Sensing Elements
C. Installations
D. Calibrations
8) FLUID-FLOW MEASUREMENTS
8.1. Introduction
8.2. Laminar and Turbulent Flow
8.3. “Direct” Flow Measurement
A. Weighing and Volumetric Methods
B. Positive-Displacement Meters
C. Flow Visualization
D. “Carrier” System
8.4. “Indirect” Flow Measurement
8.5. Square-Roots-Law Flow meters
A. Orifice and Ventura Flow meters
B. Characteristics of Square-Root-Law Flow meters
C. Pilot-Static Tubes
D. Variable-Area Flow Meters
E. Drag-Force Flow meter
8.6. Turbine Flow meters
8.7. Vortex-Shedding Flow meters
8.8. Hot-Wire and Hot- Film Anemometer
A. Constant-Temperature Anemometer
B. Constant-Current Anemometer
8.9. Mass Flow meters
A. Density Measurement
B. Direct Mass Flow meters
9) TEMPERATURE MEASUREMENT
9.1. Introduction
9.2. International Practical Temperature Scale
9.3. Expansion and Filled Thermometers
9.4. Thermocouples
A. Thermoelectric Effects
B. Thermoelectric Laws
C. Gradient Approach to Thermocouple Circuitry
D. Reference Junctions
E. Thermocouple Probes
F. Practical Thermocouple Measurement
9.5. Resistance Temperature Detectors
A. Material and Constructors
B. Characteristics and Standards
C. Circuits
D. Sources of Errors
9.6. Thermostats
9.7. Pyrometers: Principles
A. Physical Laws
B. Remittance
C. Measurement Uncertainty
9.8. Promoters
A. Brightness Pyrometers
B. Wideband and Selected-Band Pyrometer
C. Components
9.9. Miscellaneous Temperature Sensors
10) LABORATORY EXPERIMENT
10.1. Introduction
10.2. Experiment 1. Voltage Measurements:
Oscilloscopes, Millimeters, and Digital
Millimeters
E1.1. Objectives
E1.2. Introduction
E1.3. Description of Equipments
E1.4. Voltage Measurements: Experiment1-1
E1.5. Input/output Imepedances: Experiment1-2
E1.6. Loading in Measurements: Experiment1-3
E1.7. AC/DC Input Coupling: Experiment1-4
E1.8. Measurement of C in the AC Couple: Experiment1-5
E1.9.Trigger System of Oscilloscopes: Experiment1-6
E1.10. Probe Compensation: Experiment1-7
E1.11. Miscellaneous Controls: Experiment1-8
10.3. Experiment 2.Transducer and Physical Laws
E2.1. Introduction
E2.2. Equipment
E2.3. Resistive Transducer
E2.4. Capacitive Transducer
E2.5. Inductive Transducer
E2.6. Other Common Transducer
10.4. Experiment 3. Measuring Systems
E3.1. Introduction
E3.2. Acoustic Pressure Detection
E3.3. Vibration of a Simple Beam
10.5. Experiment 4. Strain Gage Application
E4.1. Objective
E4.2. Introduction
E4.3. Stress-Strain Relations: A Review
E4.4. Strain Gages and Gage Circuit
E4.5. Flexures and Cross-Sensitivity
E4.6. Equipments
E4.7. Laboratory Experience
E4.8. Pressure Transducer Calibration: Experiment4-1
E4.9. Direct and Indirect Calibrations: Experiment4-2
E4.10. Simply Supported Beam: Experiment4-3
E4.11. Tensile Test: Experiment4-4
E4.12. Compression Test: Experiment4-5
E4.13. Cross-Sensitivity: Experiment4-6
E4.14. Torsion and Bending: Experiment4-7
E4.15. Long Thin-Walled Cylindrical: Experiment4-8
E4.16. Biaxial Strain Measurements: Experiment4-9
10.6. Experiment 5. Time Response of Instruments
E5.1. Introduction
E5.2.The Models
E5.3. Demonstration of Zero-Order Instrumentation
E5.4. Demonstration of First-Order
Instrumentation
E5.5. First-Order Instrumentation
E5.6. Demonstration of Second-Order
E5.7. Second-Order System: Experiment 5-3
10.7. Experiment 6. Frequency Response of Instrumentation
E6.1. Frequency Response Method
E6.2. Demonstration of Zero-Order
E6.3. First-Order Instruments
E6.4. Second-Order Instruments
10.8. Experiments 7.Signal Conditioning
E7.1. Introduction
E7.2.Demonstration of Thermocouple Compensation
E7.3. Demonstration of Carrier Systems
E7.4. Demonstration of Amplitude Modulation and Demolition
E7.5. Characteristics of Filters
E7.6. Operational Amplifiers
Leave us your details we will revert you as soon as possible.
Copyright © 2014 - All Rights Reserved - nimtweb.org Google
Powered by Nasbar Infotech